Technical Barriers to Trade Survey 2001-2002

World, 2001 - 2002

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Reference ID

WLD_2001_TBTS_v01_M

Producer(s)

John S. Wilson (World Bank), Keith E. Maskus (University of Colorado at Boulder), Tsunehiro Otsuki (Osaka University)

Metadata

DDI/XML JSON

Study website

Created on

Nov 08, 2011

Last modified

Mar 29, 2019

Page views

31672

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434

cost_cfm_dup_exp (cost_cfm_dup_exp)

Data file: TBTdata2

Overview

Valid: 157

Invalid: 517

Type: Discrete

Decimal: 0

Start: 83

End: 83

Width: 1

Range: -

Format:

Questions and instructions

Literal question

Increase in overall testing costs due to multiple testing

Categories

Value	Category
1	0-10%
2	11-50%
3	51-100%
4	100% or more
Sysmiss

Warning: these figures indicate the number of cases found in the data file. They cannot be interpreted as summary statistics of the population of interest.

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